News
Improved Support for XFEL/SFX Deposition
10/23
The OneDep system for deposition, validation, and biocuration recently extended the range of metadata collected for structures solved by X-ray Free-Electron Laser (XFEL) and Serial Femtosecond Crystallography (SFX). Depositors can now provide details of the sample delivery, data measurement details such as focusing optics, pulse energy, frequency, and number of crystals used in new PDBx/mmCIF categories dedicated to XFEL and SFX experiments.
Authors of existing XFEL entries in the PDB archive will be contacted to provide additional information for their entries.